NIKON ALTERA 10.10.8

Nikon Metrology’s range of premium quality ALTERA CMM’s have been refined to meet the varying needs of manufacturers, both now and in the future. Advanced multi-sensor ready technology optimizes C...

NIKON ALTERA 10.7.6

Nikon Metrology’s range of premium quality ALTERA CMM’s have been refined to meet the varying needs of manufacturers, both now and in the future. Advanced multi-sensor ready technology optimizes C...

NIKON ALTERA 12.10.8

Nikon Metrology’s range of premium quality ALTERA CMM’s have been refined to meet the varying needs of manufacturers, both now and in the future. Advanced multi-sensor ready technology optimizes C...

NIKON ALTERA 15.10.8

Nikon Metrology’s range of premium quality ALTERA CMM’s have been refined to meet the varying needs of manufacturers, both now and in the future. Advanced multi-sensor ready technology optimizes C...

NIKON ALTERA 15.7.6

Nikon Metrology’s range of premium quality ALTERA CMM’s have been refined to meet the varying needs of manufacturers, both now and in the future. Advanced multi-sensor ready technology optimizes C...

NIKON ALTERA 20.10.8

Nikon Metrology’s range of premium quality ALTERA CMM’s have been refined to meet the varying needs of manufacturers, both now and in the future. Advanced multi-sensor ready technology optimizes C...

NIKON ALTERA 7.5.5

Nikon Metrology’s range of premium quality ALTERA CMM’s have been refined to meet the varying needs of manufacturers, both now and in the future. Advanced multi-sensor ready technology optimizes C...

NIKON ALTERA 8.7.6

Nikon Metrology’s range of premium quality ALTERA CMM’s have been refined to meet the varying needs of manufacturers, both now and in the future. Advanced multi-sensor ready technology optimizes C...

NIKON C3 V

With super-light aluminium as a key structural component, and air bearings on all axes, the C3 V bridge CMM is a high performance and cost-effective metrology solution. Due to its size, high capaci...

NIKON LK V-GP

Made for large scale metrology applications the LK V-GP, with its elevated rails, offers the best of all worlds. High accuracy with maximum volume and full support for a variety of probing solution...

NIKON LK H

Nikon Metrology’s range of horizontal arm CMMs provides unequalled performance in speed, accuracy and repeatability. Ceramic guideways and air bearings used in the construction of LK H CMMs, offer ...

NIKON LK V 20.12.10

LK V bridge CMMs are standardly available in a wide range of measurement volumes ranging from LK V 6.5.4 to LK V 40.20.15 covering most inspection applications. For applications requiring specific ...

NIKON LK V R-SL

NIKON LK V-R

The LK V-R is high accuracy and reliable large scale CMM with an enhanced design featuring a unique 'I' section bonded ceramic beam on twin rails. It is based around a common modular design concept...

NIKON LK V-SL HA

The LK V-SL features a revolutionary design that delivers the best scanning and inspection performance currently available in the marketplace. Particularly suited to meet the demands of automotive ...

NIKON MCT225

This new ‘absolute-accuracy’ Metrology-CT (MCT) system guarantees that all internal and external geometry is measured efficiently. A proprietary liquid cooled micro-focus reflection source and air-...

NIKON MCT225 HA

This new ‘absolute-accuracy’ Metrology-CT (MCT) system guarantees that all internal and external geometry is measured efficiently with the highest accuracy. A proprietary liquid cooled microfocus t...

NIKON NEXIV VMR-C4540

The NEXIV VMR-C4540 - designed for use with 300mm Front Opening Unified Pod (FOUP) & Front Opening Shipping Box (FOSB) wafer carriers - detects hard to see edges using a variety of illumination fea...

NIKON OPTISTATION-3100

Engineered to provide cost-effective support for 300mm wafers with a minimal footprint, the Optistation-3100 features an advanced micro/macro system in a compact, flexible design. The optical syste...

NIKON OPTISTATION-3200

One of Nikon's most advanced and versatile semiconductor inspection systems, the Optistation 3200 provides three-mode macro inspection capability – front, backside center, and backside perimeter – ...

NIKON OPTISTATION-7

Built to accept the latest technology in wafer transport, and incorporating its own integrated ULPA filtration system, the Optistation-7 easily exceeds new fab automation requirements. Nikon semico...

NIKON XT H 225

The versatile XT H 225 system offers a powerful microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction. They cover a wide range of ap...

NIKON XT H 225 LC

The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320kV...

NIKON XT H 320 LC

The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320kV...

NIKON XT H 450

The XT H 450 system offers the necessary source power to penetrate through high density parts and generate a scatter-free CT volume with micron accuracy. The system is available with a flat panel o...

NIKON XT V 130C

The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130kv/10 watt Nikon Metrology manufactured source, a globally recognize...

NIKON XT V 160

The XT V 160 is specifically designed for use in production lines and failure analysis laboratories. With a precision joystick, system users control the 5-axis sample manipulator. Real-time X-ray a...

NIKON XT V 160 NF

XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applic...