1 - 50の72 モデル
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MITUTOYO VMU-H

Features: - Small, lightweight microscope unit (Suitable for observing a wide range of objects: metal, resin, printed surfaces, minute mechanisms, etc.) - Can used with YAG (near-infrared, visible...

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MITUTOYO VMU-V

Features: - Small, lightweight microscope unit (Suitable for observing a wide range of objects: metal, resin, printed surfaces, minute mechanisms, etc.) - Can used with YAG (near-infrared, visible...

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NIKON AZ100 MULTIZOOM

The AZ100 Multizoom represents a new concept in zoom microscopes. It covers an extremely wide range of magnifications, from 5x to 400x, effectively combining the advantages provided by stereo zoom ...

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NIKON BW-S501

Nikon’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to su...

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NIKON BW-S502

Nikon’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to su...

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NIKON BW-S503

Nikon’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to su...

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NIKON BW-S505

Nikon’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to su...

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NIKON BW-S506

Nikon’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to su...

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NIKON BW-S507

Nikon’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to su...

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NIKON ECLIPSE CI-POL

Slim and compact, the ECLIPSE Ci-POL is a personal-type polarizing microscope that doesn't occupy your entire desk. With cutting-edge CFI60 infinity optics, it offers advanced optical performance a...

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NIKON ECLIPSE E200 POL

Ideal as an educational microscope or for routine laboratory use for biology, geology and industry, the Eclipse E200 POL incorporates Nikon's acclaimed CFI60 infinity optical system to provide a hi...

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NIKON ECLIPSE L200N

Combined with Nikon's superior CFI60 LU/L optical system and an extraordinary new illumination system, this microscope provides images with greater contrast, high resolving power and darkfield imag...

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NIKON ECLIPSE L200ND

Combined with Nikon's superior CFI60 LU/L optical system and an extraordinary new illumination system, this microscope provides images with greater contrast, high resolving power and darkfield imag...

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NIKON ECLIPSE L300N

Nikon Eclipse L300N/L300ND FPD / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluores...

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NIKON ECLIPSE L300ND

Nikon Eclipse L300N/L300ND FPD / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluores...

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NIKON ECLIPSE LV-DAF

The LV-DAF delivers fast, versatile autofocus with the Hybrid Auto-Focus system, making the most of two types of auto focus systems. Combining slit projection and contrast detection auto focus, it ...

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NIKON ECLIPSE LV100DA-U

A motorized microscope with episcopic/diascopic illumination ,which meets the various needs of observation, inspection, research, and analysis across a wide range of industrial fields. Higher NA an...

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NIKON ECLIPSE LV100N POL

Nikon's Eclipse polarizing microscopes are renowned for their abilitiy to produce brighter, clearer, and higher contrast images. The LV100N POL, available in diascopic and episcopic microscope illu...

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NIKON ECLIPSE LV100ND

A manual microscope with episcopic/diascopic illumination, which meets the various needs of observation, inspection, research, and analysis across a wide range of industrial fields. Higher NA and a...

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