SUNPOC JBW-450H
- Descrizione del prodotto
Specification:
Model JBW-450H
Impact Energy 450J
Scale Range 0-450J
resolution 3J
Distance between Axis of Pendulum Shaft and Striking Center 750mm
Maximal Impact Speed 5.2m/s
Span of Test Sample Support 40 +0.2mm
Radius of Circular Arc in the End Part of the Test Sample Support R1+0.5mm
Radius of Circular Arc of Impact Blade R2.25, R8
Included Angle of Impact Cutter 30°+±1°
Pre-raising Angle of the Pendulum Hammer 150°
Thickness of Impact Cutter 16 mm
Specification of Test Sample 10×10×55 mm
Precision of Force Transducer ≤±1%FS
Resolution of Angular Displacement Transducer 0.1°
Impact test POWER AC 380V 50Hz - Circa la società
Being a professional manufacturer and exporter in the field of of quality test instruments, Sunpoc mainly supplys optical profile projectors, video measuring machines, toolmaker microscopes, digital readout, linear scales, hardness tester, digital caliper and measuring software, etc. The products are widely applied for in the industry of mechanic, electronic, mold and hardware for quality control etc. Adhere to the "quality first, users first" business purposes and “Creating the 1st class domestic supplier, setting up international name brands” as the developing target of the enterprise, the Sunpoc team has worked and researched with constantly efforts to improve the quality and explore new products to serve the customers better. Under the scientific and strict management and always deliver on time and honor the contract, Sunpoc has enjoyed a good reputation both home and abroad. Currently our product has passed the ISO9001:2000, Certification of 2000 International Quality Control System, CE Certification and verification of ISO1002-1 Metering Certification System. Sunpoc has already established some distributor in mainly district in the world with its service and technical support networks. At the same time, our team will bring professional service for each of our customer. Today, we are willing to work with the worldwide lifeful partner for a better tomorrow, to climb up a new height of optical measurements. Let us fight together!